IEEE Transactions on Circuits & Systems II Express Briefs · 2013 · 17 citations · 16 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesVlsi DesignClock ManagementCmos Circuit DesignStandard Cell DesignTiming AnalysisTiming ClosureVoltage ScalingFlip-flop ArchitectureFlip-flop DesignFlip-flopsHigh-speed Cmos DesignThreshold VoltageThreshold Voltage ScalingTransistor ScalingVoltage Scaling For Process Variation
Pulse-triggered flip-flops are candidates to improve pipeline speed, although flip-flop robustness and system timing closure are challenging in a wide range of supply voltages. Pulse-triggered flip-flops usually have specific structures and transistor sizes to optimize performance. The topology, transistor size, and threshold voltage of the flip-flop make the timing characteristics sensitive to the supply voltage. The transparent windows generated and required in a pulse-triggered flip-flop may have mismatch under supply voltage scaling, which is likely to result in functional and system timing failures. Therefore, this brief proposes an adaptive pulse-generating method to fit the transparent window required in situ. Process variations and intrinsic transistor driving-strength mismatches are considered. The proposed structure improves the robustness of pulse-triggered flip-flops and promises this high-speed clocked element for wide-voltage-range operations. A normalized timing metric is also introduced to characterize flip-flops and help timing tradeoffs in wide-voltage-range operations.
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A 280mV-to-1.2V wide-operating-range IA-32 processor in 32nm CMOS
Shailendra Jain, Surhud Khare, Satish Yada et al. · 2012 · 265 citations
Engineering, Computer Engineering, Electrical Engineering +17
The implementation of the Itanium 2 microprocessor
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