Journal of Electronic Testing · 2010 · 14 citations · 19 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingFault-tolerant SystemsMicroelectronicsBuilt-in Self-testDesign For TestabilityDevice ReliabilityFault DetectionHardware Fault ToleranceSemiconductor ReliabilityFault-tolerant ArchitectureMemory Fault ToleranceSoft Error DetectionSoft ErrorsTest Time Efficiency
19
George L. Maddox · The Gerontologist · 1964 · 577 citations
Education, Psychiatry, Sociology +3
Functional memory faults: a formal notation and a taxonomy
A.J. van de Goor, Zaid Al-Ars · 2002 · 202 citations
Testing for resistive opens and stuck opens
J.C.M. Li, Chao-Wen Tseng, E.J. McCluskey · 2002 · 147 citations
Engineering, Computer Engineering, Electrical Engineering +15