R. Rodríguez‐Montañés

Author

Universitat Politècnica de Catalunya ORCID

Also Known As

R Rodrı́guez-Montañés, R. Rodriguez-Montanes, R. Rodríguez-Montañés, R. Rodríguez-Montañés, R. RodríGuez-Montañés, R. Rodríguez-Montañés, R. Rodríguez‐Montañés, R.R. Montanes, Rodríguez Montañés, Rosa, Rosa Rodrguez-Montas

Publications

1.1K

Citations

H-Index

Concepts

All Affiliations

Universitat Politècnica de Catalunya NXP (Netherlands)Centro Nacional de Microelectrónica Consejo Superior de Investigaciones Científicas Technical University of Munich

About

R. Rodríguez‐Montañés is an author at Universitat Politècnica de Catalunya specializing in computer engineering, engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	15	21	848
2	Computer Engineering	15	17	802
3	Applied Physics	5	5	225
4	Education	4	4	240
5	Computer Science	4	4	250

R. Rodríguez‐Montañés

Publications

859

Citations

H-Index

Page 1

	Year	Citations
Bridging defects resistance measurements in a CMOS process R. Rodríguez‐Montañés, E.M.J.G. Bruis, J. Figueras Poor ContactsDefect ToleranceElectrical EngineeringTlirs High ResisturictEngineering	1992	178
Resistance characterization for weak open defects R. Rodríguez‐Montañés, José Pineda de Gyvez, Paul A. J. Volf IEEE Design & Test of Computers EngineeringWeak Open DefectsVerificationStrong Open DefectsResistance Characterization	2002	168
CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS R. Rodríguez‐Montañés, J. Segura, Victor Champac, Electrical EngineeringEngineeringHardware ReliabilityBias Temperature InstabilityComputer Engineering	2005	108
Experimental Characterization of CMOS Interconnect Open Defects Daniel Arumí, R. Rodríguez‐Montañés, Joan Figueras IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Defect ToleranceElectrical EngineeringEngineeringNanoelectronicsBias Temperature Instability	2007	57
Defective Behaviours of Resistive Opens in Interconnect Lines Daniel Arumí, R. Rodríguez‐Montañés, Joan Figueras EngineeringMem TestingInterconnect (Integrated Circuits)Open DefectsOpen Defect	2005	41
The Low Area Probing Detector as a Countermeasure Against Invasive Attacks Michael P. Weiner, Salvador Manich, R. Rodríguez‐Montañés, IEEE Transactions on Very Large Scale Integration (VLSI) Systems Hardware TrojanEngineeringMeasurementComputer ArchitectureEducation	2017	41
Unpredictable Bits Generation Based on RRAM Parallel Configuration Daniel Arumí, Álvaro Gómez‐Pau, Salvador Manich, IEEE Electron Device Letters EngineeringEmerging Memory TechnologyComputer ArchitectureUnpredictable BitsHardware Systems	2018	30
Analysis of bridging defects in sequential CMOS circuits and their current testability R. Rodríguez‐Montañés, Joan Figueras Hardware SecurityControllability ConditionsElectrical EngineeringEngineeringCircuit System	2002	27
Diagnosis of Full Open Defects in Interconnecting Lines R. Rodríguez‐Montañés, Daniel Arumí, Joan Figueras, Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium EngineeringDiagnosisDefect ToleranceInterconnect (Integrated Circuits)Electromagnetic Compatibility	2007	26
Current vs. logic testability of bridges in scan chains R. Rodríguez‐Montañés, Joan Figueras, Antonio Rubio Electrical EngineeringReliability EngineeringEngineeringScan ChainsBridge Design	2002	23

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