R. Rodríguez‐Montañés

Bridging defects resistance measurements in a CMOS process

R. Rodríguez‐Montañés, E.M.J.G. Bruis, J. Figueras · 1992 · 178 citations

Poor Contacts, Defect Tolerance, Electrical Engineering +13

Resistance characterization for weak open defects

R. Rodríguez‐Montañés, José Pineda de Gyvez, Paul A. J. Volf · IEEE Design & Test of Computers · 2002 · 168 citations · Full text

Engineering, Weak Open Defects, Verification +21

CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS

R. Rodríguez‐Montañés, J. Segura, Victor Champac et al. · 2005 · 108 citations

Electrical Engineering, Engineering, Hardware Reliability +5

Experimental Characterization of CMOS Interconnect Open Defects

Daniel Arumí, R. Rodríguez‐Montañés, Joan Figueras · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2007 · 57 citations

Defect Tolerance, Electrical Engineering, Engineering +13

Defective Behaviours of Resistive Opens in Interconnect Lines

Daniel Arumí, R. Rodríguez‐Montañés, Joan Figueras · 2005 · 41 citations

Engineering, Mem Testing, Interconnect (Integrated Circuits) +16