Daniel Arumí

Experimental Characterization of CMOS Interconnect Open Defects

Daniel Arumí, R. Rodríguez‐Montañés, Joan Figueras · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2007 · 57 citations

Defect Tolerance, Electrical Engineering, Engineering +13

Defective Behaviours of Resistive Opens in Interconnect Lines

Daniel Arumí, R. Rodríguez‐Montañés, Joan Figueras · 2005 · 41 citations

Engineering, Mem Testing, Interconnect (Integrated Circuits) +16

Unpredictable Bits Generation Based on RRAM Parallel Configuration

Daniel Arumí, Álvaro Gómez‐Pau, Salvador Manich et al. · IEEE Electron Device Letters · 2018 · 30 citations · Full text

Engineering, Emerging Memory Technology, Computer Architecture +21

Diagnosis of Full Open Defects in Interconnecting Lines

R. Rodríguez‐Montañés, Daniel Arumí, Joan Figueras et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007 · 26 citations

Engineering, Diagnosis, Defect Tolerance +18

Post-bond test of Through-Silicon Vias with open defects

R. Rodríguez‐Montañés, Daniel Arumí, J. Figueras · 2014 · 16 citations

Engineering, Silicon Vias, Integrated Circuits +17