CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS

Inductive Fault Analysis of MOS Integrated Circuits

John Paul Shen, W. Maly, Frances Ferguson · IEEE Design & Test of Computers · 1985 · 508 citations

Engineering, Computer Science, Electrical Engineering +16

A charge-oriented model for MOS transistor capacitances

D.E. Ward, R.W. Dutton · IEEE Journal of Solid-State Circuits · 1978 · 402 citations

Engineering, Computer Engineering, Electrical Engineering +17

Realistic fault modeling for VLSI testing

W. Maly · 1987 · 241 citations

Engineering, Computer Engineering, Electrical Engineering +14

Diagnosing CMOS bridging faults with stuck-at fault dictionaries

S.D. Millman, E.J. McCluskey, John M. Acken · 2002 · 161 citations

Engineering, Computer Engineering, Electrical Engineering +7

Testing oriented analysis of CMOS ICs with opens

W. Maly, P. K. Nag, P. Nigh · 2003 · 153 citations

Engineering, Computer Engineering, Electrical Engineering +10