CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS - Concepedia

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CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS

108

Citations

19

References

2005

Year

R. Rodríguez‐Montañés, J. Segura, Victor Champac, Joan Figueras, Javier Rubio

Unknown Venue

Electrical EngineeringEngineeringHardware ReliabilityBias Temperature InstabilityComputer EngineeringCircuit ReliabilityMicroelectronicsSilicon Debugging

References

	Year	Citations

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