J. Segura

CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS

R. Rodríguez‐Montañés, J. Segura, Victor Champac et al. · 2005 · 108 citations

Engineering, Computer Engineering, Electrical Engineering +10

Using the Electronic Nose to Identify Airway Infection during COPD Exacerbations

Hanaa Shafiek, Federico Fiorentino, José Luís Merino et al. · PLoS ONE · 2015 · 79 citations · Full text

Veterinary Medicine, Infectious Diseases, Diagnostic Microbiology +16

Parametric failures in CMOS ICs - a defect-based analysis

J. Segura, A. Keshavarzi, J.M. Soden et al. · 2003 · 64 citations

Engineering, Computer Engineering, Electrical Engineering +15

Quiescent current sensor circuits in digital VLSI CMOS testing

Antonio Rubio, Joan Figueras, J. Segura · Electronics Letters · 1990 · 60 citations

Engineering, Computer Engineering, Electrical Engineering +11

An Analytical Charge-Based Compact Delay Model for Submicrometer CMOS Inverters

Josep L. Rosselló, J. Segura · IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications · 2004 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +17