Extreme Ultraviolet Lithography Using Small-Field Exposure Tool: Current Status

Kazuo Tawarayama, Shunko Magoshi, Yuusuke Tanaka, Seiichiro Shirai

Japanese Journal of Applied Physics · 2008 · 31 citations · 3 references

Concepts

Abstract

The small-field exposure tool (SFET) for extreme ultraviolet (EUV) lithography was manufactured by Canon and EUVA and installed in Selete. It is being used for developing mask, resist, and tool technologies. In this paper, we review the current status of SFET development and present some initial results on lithographic performance and tool stability.

References

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