Statistics
Publications
15
Citations
518
H-Index
12
Active since
2002
Jason P. Cain is an author at University of California, Berkeley specializing in engineering, computer engineering, and microelectronics.
Publications per year
2002–2016
15
15
Electrical linewidth metrology for systematic CD variation characterization and causal analysis
Jason P. Cain, Costas J. Spanos · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 32 citations
Systematic Cd Variation, Electrical Engineering, Engineering +11
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