Applied Physics Letters · 1981 · 17 citations · 12 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDopingIon ImplantationOptoelectronic DevicesPhotovoltaic DevicesSilicon MaterialsSolar CellsDopant EffectsDopant ImplantationElectrical PropertiesFill FactorLaser AnnealingOpen-circuit VoltageShort-circuit CurrentSilicon
This letter provides the first experimental evidence that substrate heating during pulsed-laser annealing (PLA) of ion-implanted silicon can significantly improve the electrical properties of the laser recrystalized region due to the reduction of the regrowth velocity. It is also shown that by using the optimum PLA condition, the open-circuit voltage VOC and the fill factor of ion-implanted, laser-annealed solar cells are improved by increasing the emitter dopant concentrations, whereas the short-circuit current JSC remains fairly constant, results which are in qualitative agreement with theoretical predictions.
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Hydrogen passivation of point defects in silicon
J. L. Benton, C. J. Doherty, S. D. Ferris et al. · Applied Physics Letters · 1980 · 174 citations
Defects in laser damaged silicon observed by DLTS
P. M. Mooney, R. T. Young, James P. Karins et al. · physica status solidi (a) · 1978 · 49 citations
Natural Sciences, Materials Engineering, Materials Science +10