Concepedia

Correlation between thermal resistance, channel temperature, infrared thermal maps and failure mechanisms in low power MESFET devices

C. Canali, F.M. Chiussi, Gianpaolo Donzelli, F. Magistrali, Enrico Zanoni

Microelectronics Reliability · 1989 · 17 citations · 4 references

DOI

Concepts

References

4

Determination of the Basic Device Parameters of a GaAs MESFET

H. Fukui · Bell System Technical Journal · 1979 · 250 citations

, , +14

Gate metallization "Sinking" into the active channel in Ti/W/Au metallized power MESFET's

C. Canali, F. Castaldo, F. Fantini et al. · IEEE Electron Device Letters · 1986 · 73 citations

, , +13

Thermal resistance of GaAs field-effect transistors

H. Fukui · 1980 · 53 citations

, , +15

Gold-based gate-sinking enhanced by inhomogeneities in power MESFETs

C. Canali, Gianpaolo Donzelli, F. Fantini et al. · Electronics Letters · 1987 · 12 citations

, , +8