Fully automatic VLSI diagnosis in a CAD-linked E-beam probing system

International Test Conference 1984

IEEE Design & Test of Computers · 1984 · 42 citations

Education, Educational Measurement, Test Development +2

International Test Conference

IEEE Design & Test of Computers · 1986 · 37 citations

Electron-beam testing of VLSI circuits

E. Wolfgang, R. Lindner, Péter Fazekas et al. · IEEE Transactions on Electron Devices · 1979 · 26 citations

Engineering, Computer Engineering, Electrical Engineering +12

Electron-beam testing of VLSI circuits

E. Wolfgang, Péter Fazekas, H.P. Feuerbaum et al. · IEEE Journal of Solid-State Circuits · 1979 · 26 citations

Engineering, Computer Engineering, Electrical Engineering +12

A high speed signal averager for electron beam test systems

D. Machin, D. W. Ranasinghe, Gordon Proctor · Microelectronic Engineering · 1987 · 21 citations

Engineering, Electrical Engineering, Physics +11