2002 · 10 citations · 1 references
EngineeringComputer EngineeringElectrical EngineeringAutomationEmbedded SystemsInterconnection NetworksDesign For TestabilityElectrical System TestingSoftware TestingBoundary ScanBoundary Scan ArchitectureBoundary Scan TestingInterconnect Testing
Presents the new technology that extends today's JTAG's capability from DC domain to both AC and DC domains. New concept, AC_EXTEST is introduced to support AC interconnection test and to have backward compatibility with EXTEST. It leverages existing application software available within the boundary-scan test industry to promote this technology to the manufacturing floor with minimal impact.
1
An embedded technique for at-speed interconnect testing
Benoit Nadeau-Dostie, J-F Cote, H. Hulvershorn et al. · 2003 · 41 citations
Engineering, Computer Engineering, Electrical Engineering +17