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Tokyo, Japan
229
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1–5 of 17
Effect of thermal aging on board level drop reliability for Pb-free BGA packages
Tz-Cheng Chiu, Kejun Zeng, R.J. Stierman et al. · 2004 · 248 citations
Interface trap-enhanced gate-induced leakage current in MOSFET
I.-C. Chen, C.W. Teng, D. J. Coleman et al. · IEEE Electron Device Letters · 1989 · 100 citations
Engineering, Electrical Engineering, Electronic Materials +16
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