Wafer Cleaning
Wafer Cleaning is a methodological process within semiconductor manufacturing that systematically removes contaminants, particles, and impurities from the surface of a silicon wafer to ensure optimal substrate integrity and performance in subsequent cleanroom processing steps.
400
Publications
14.9K
Citations
1.6K
Authors
385
Institutions
Publications per year
2017–2026
46
Variants
Wafer Surface Cleaning
400
1–5 of 400
1.6K
10
h-index
9
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7
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6
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6
h-index
1–5 of 1.6K
385
IMEC
Leuven, Belgium
15 h-index
111 publications
4.6K citations
University of Arizona
Tucson, United States
12 h-index
47 publications
1.1K citations

Tohoku University
Sendai, Japan
12 h-index
44 publications
2K citations

Centre National de la Recherche Scientifique
Paris, France
12 h-index
36 publications
744 citations
IBM (United States)
Armonk, United States
10 h-index
43 publications
1.2K citations
Hitachi (Japan)
Tokyo, Japan
9 h-index
24 publications
739 citations

Hanyang University
Seoul, South Korea
8 h-index
25 publications
1.3K citations
Intel (United States)
Santa Clara, United States
8 h-index
27 publications
824 citations
1–8 of 385
JES · 53 publications · 3.7K citations
27
h-index
JJAP · 23 publications · 1.1K citations
16
h-index
18 publications · 648 citations
14
h-index
17 publications · 434 citations
14
h-index
16 publications · 349 citations
13
h-index
1–5