Wafer Cleaning

Wafer Cleaning is a methodological process within semiconductor manufacturing that systematically removes contaminants, particles, and impurities from the surface of a silicon wafer to ensure optimal substrate integrity and performance in subsequent cleanroom processing steps.

400

Publications

14.9K

Citations

1.6K

Authors

385

Institutions

Publications per year

2017–2026

46

Variants

Wafer Surface Cleaning

Authors

1.6K

  1. PM
    Paul Mertens

    IMEC, Belgium

    11 publications · 385 citations

    10

    h-index

  2. AB
    Ahmed Busnaina

    Northeastern University, United States

    9 publications · 466 citations

    9

    h-index

  3. TO
    T. Ohmi

    Tohoku University, Japan

    7 publications · 408 citations

    7

    h-index

  4. MH
    Marc Heyns

    IMEC, Belgium

    6 publications · 275 citations

    6

    h-index

  5. RV
    Rita Vos

    IMEC, Belgium

    6 publications · 180 citations

    6

    h-index

1–5 of 1.6K

Venues

  1. Journal of The Electrochemical Society

    JES · 53 publications · 3.7K citations

    27

    h-index

  2. Japanese Journal of Applied Physics

    JJAP · 23 publications · 1.1K citations

    16

    h-index

  3. IEEE Transactions on Semiconductor Manufacturing

    18 publications · 648 citations

    14

    h-index

  4. Journal of Applied Physics

    17 publications · 434 citations

    14

    h-index

  5. Microelectronic Engineering

    16 publications · 349 citations

    13

    h-index

1–5