Test Data Reduction is a design for testability technique that reduces the volume of test inputs and outputs required for testing integrated circuits by compressing test stimuli and/or compacting response data, thereby distinguishing itself from other testability methods through its focus on minimizing data transfer and storage overhead in test processes.
556
Publications
27.5K
Citations
1.5K
Authors
501
Institutions
Publications per year
2017–2026
99
Parents
Publications
556
<i>Shock and Vibration Handbook</i>
Cyril M. Harris, Charles E. Crede, Horace M. Trent · Physics Today · 1962 · 1K citations
Engineering, Aerospace Engineering, Mechanical Engineering +17
1–5 of 556
Authors
1.5K
- KC
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1–5 of 1.5K
Institutions
501
Duke University
Durham, United States
20 h-index
45 publications
2.7K citations
University of Iowa
Iowa City, United States
17 h-index
29 publications
975 citations
Mentor Technologies
Tulsa, United States
16 h-index
70 publications
8.1K citations
Poznań University of Technology
Poznan, Poland
15 h-index
25 publications
2.1K citations
University of California San Diego
San Diego, United States
14 h-index
30 publications
1.3K citations
Intel (United States)
Santa Clara, United States
13 h-index
28 publications
2K citations
Siemens (Hungary)
Budapest, Hungary
13 h-index
43 publications
2.8K citations
Purdue University West Lafayette
West Lafayette, United States
13 h-index
24 publications
594 citations
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Venues
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
22 publications · 1.8K citations
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- Journal of Physics Conference Series
13 publications · 227 citations
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- IEEE Transactions on Computers
10 publications · 674 citations
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- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
9 publications · 409 citations
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- IEEE Design & Test of Computers
6 publications · 217 citations
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