Concepedia

Scan Chain Insertion

Scan Chain Insertion is a design for testability technique that integrates sequential elements into a shift register chain to enable controllability and observability of internal circuit states during testing.

47

Publications

1.8K

Citations

115

Authors

48

Institutions

Publications per year

2017–2026

5

Parents

Publications

47

A partial scan method for sequential circuits with feedback

Kwang‐Ting Cheng, Vishwani D. Agrawal · IEEE Transactions on Computers · 1990 · 355 citations

, , +17

Instruction randomization self test for processor cores

Kenneth William Batcher, C. Papachristou · 2003 · 131 citations

, , +16

Design of compactors for signature-analyzers in built-in self-test

P. Wohl, J.A. Waicukauski, T.W. Williams · 2002 · 85 citations

, , +14

A Sequential Circuit Test Generation System.

Sivanarayana Mallela, Shianling Wu · International Test Conference · 1985 · 81 citations

, , +11

Hardware Trojan Detection Using ATPG and Model Checking

Jonathan Cruz, Farimah Farahmandi, Alif Ahmed et al. · 2018 · 73 citations

, , +12

1–5 of 47

Authors

115

  1. OS
    Ozgur Sinanoglu

    New York University, United States

    7 publications · 138 citations

    7

    h-index

  2. AO
    Alex Orailoğlu

    University of California San Diego, United States

    4 publications · 95 citations

    4

    h-index

  3. MF
    Marie-Lise Flottes

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    3 publications · 148 citations

    3

    h-index

  4. MT
    Mark Tehranipoor

    University of Florida, United States

    3 publications · 102 citations

    3

    h-index

  5. CR
    C.P. Ravikumar

    Texas Instruments (United States), United States

    3 publications · 90 citations

    3

    h-index

1–5 of 115

Institutions

48

  1. University of California San Diego

    San Diego, United States

    6 h-index

    13 publications

    303 citations

  2. Texas Instruments (United States)

    Dallas, United States

    4 h-index

    10 publications

    321 citations

  3. Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier

    Montpellier, France

    4 h-index

    15 publications

    721 citations

  4. University of Maryland, Baltimore County

    Baltimore, United States

    3 h-index

    5 publications

    168 citations

  5. University of Iowa

    Iowa City, United States

    3 h-index

    5 publications

    99 citations

  6. The University of Texas at Austin

    Austin, United States

    2 h-index

    4 publications

    178 citations

  7. Princeton University

    Princeton, United States

    2 h-index

    4 publications

    40 citations

  8. Centre National de la Recherche Scientifique

    Paris, France

    2 h-index

    8 publications

    360 citations

1–8 of 48

Venues

  1. ACM Transactions on Design Automation of Electronic Systems

    TODAES · 3 publications · 120 citations

    3

    h-index

  2. 2

    h-index

  3. IEEE Transactions on Reliability

    1 publications · 14 citations

    1

    h-index

  4. The European Physical Journal E

    1 publications · 21 citations

    1

    h-index

  5. Measurement and Control

    1 publications · 15 citations

    1

    h-index

1–5