Rf Mems Reliability

RF MEMS Reliability is a performance evaluation framework that assesses the operational consistency and failure resilience of radio-frequency micro-electromechanical systems over time under varying environmental and electrical stresses.

179

Publications

7.3K

Citations

507

Authors

163

Institutions

Publications per year

2017–2026

11

Parents

Authors

507

  1. GM
    Gabriel M. Rebeiz

    University of California San Diego, United States

    19 publications · 1.9K citations

    16

    h-index

  2. RP
    R. Plana

    Laboratoire d'Analyse et d'Architecture des Systèmes, France

    13 publications · 422 citations

    11

    h-index

  3. BM
    B. Margesin

    Fondazione Bruno Kessler, Italy

    10 publications · 167 citations

    10

    h-index

  4. GM
    Gaudenzio Meneghesso

    University of Padua, Italy

    11 publications · 253 citations

    10

    h-index

  5. ID
    Ingrid De Wolf

    IMEC, Belgium

    11 publications · 551 citations

    10

    h-index

1–5 of 507

Venues

  1. 13

    h-index

  2. Microelectronics Reliability

    14 publications · 457 citations

    12

    h-index

  3. Journal of Micromechanics and Microengineering

    JMM · 11 publications · 714 citations

    10

    h-index

  4. Journal of Microelectromechanical Systems

    8 publications · 334 citations

    8

    h-index

  5. Microsystem Technologies

    7 publications · 153 citations

    7

    h-index

1–5