Process Variation Robust Design

Process Variation Robust Design is a methodology in integrated circuit design that inherently accommodates manufacturing-induced parameter deviations by optimizing circuit performance and reliability under statistical process variations, thereby distinguishing itself from conventional design approaches through its explicit focus on variability tolerance.

143

Publications

5.4K

Citations

420

Authors

133

Institutions

Publications per year

2017–2026

Parents

Integrated Circuit Design

Publications

143

High-performance CMOS variability in the 65-nm regime and beyond

K. Bernstein, D.J. Frank, Anne Gattiker et al. · IBM Journal of Research and Development · 2006 · 557 citations

Engineering, Computer Engineering, Electrical Engineering +17

FreePDK: An Open-Source Variation-Aware Design Kit

James E. Stine, Ivan D. Castellanos, Michael Wood et al. · 2007 · 429 citations

Engineering, Computer Engineering, Digital Design +17

Quality Loss Functions for Optimization across Multiple Response Surfaces

Allan E. Ames, Neil Mattucci, Stephen MacDonald et al. · Journal of Quality Technology · 1997 · 165 citations

Architecture, Industrial Engineering, Manufacturing Engineering +17

Novel sizing algorithm for yield improvement under process variation in nanometer technology

Seung Hoon Choi, Bipul C. Paul, Kaushik Roy · 2004 · 151 citations

Engineering, Computer Engineering, Electrical Engineering +17

Experimental Design for Product and Process Design and Development

Douglas C. Montgomery · Journal of the Royal Statistical Society Series D (The Statistician) · 1999 · 142 citations

Engineering, Design, Industrial Engineering +16

1–5 of 143

Authors

420

SN
Sani Nassif
IBM Research - Austin, United States
10 publications · 893 citations
10
h-index
AB
Andrew B. Kahng
University of California San Diego, United States
7 publications · 144 citations
7
h-index
KR
Kaushik Roy
Purdue University West Lafayette, United States
6 publications · 371 citations
6
h-index
HG
Helmut Graeb
Technical University of Munich, Germany
5 publications · 95 citations
5
h-index
SS
Sachin S. Sapatnekar
University of Minnesota, United States
4 publications · 176 citations
4
h-index

1–5 of 420

Institutions

133

1–8 of 133

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
9 publications · 414 citations
9
h-index
IEEE Transactions on Semiconductor Manufacturing
5 publications · 212 citations
5
h-index
IEEE Design & Test of Computers
4 publications · 76 citations
4
h-index
Proceedings. 42nd Design Automation Conference, 2005.
Conference · 4 publications · 50 citations
4
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
3 publications · 47 citations
3
h-index

1–5