Process Variation Effects

Process Variation Effects is a phenomenon in device reliability that refers to the deviations in device performance and lifetime caused by inherent fluctuations in manufacturing processes, distinguishing it from other reliability degradation mechanisms by its origin in parametric inconsistencies during fabrication.

381

Publications

15.7K

Citations

1.2K

Authors

358

Institutions

Publications per year

2017–2026

Parents

Device Reliability

Publications

381

A 160 mV Robust Schmitt Trigger Based Subthreshold SRAM

Jaydeep P. Kulkarni, Keejong Kim, Kaushik Roy · IEEE Journal of Solid-State Circuits · 2007 · 479 citations

Engineering, Computer Engineering, Electrical Engineering +16

The Impact of Product Variety on Automobile Assembly Operations: Empirical Evidence and Simulation Analysis

Marshall L. Fisher, Christopher D. Ittner · Management Science · 1999 · 414 citations · Full text

Engineering, Industrial Engineering, Operations Management +15

Drug abuse treatment retention and process effects on follow-up outcomes

D. Dwayne Simpson, George W. Joe, Grace A. Rowan‐Szal · Drug and Alcohol Dependence · 1997 · 319 citations

Education, Psychiatry, Addiction Counseling +15

Quality Control Charts<sup>1</sup>

W. A. Shewhart · Bell System Technical Journal · 1926 · 314 citations

Engineering, Industrial Engineering, Quality Management +10

Variation-Aware Application Scheduling and Power Management for Chip Multiprocessors

Radu Teodorescu, Josep Torrellas · ACM SIGARCH Computer Architecture News · 2008 · 290 citations

Engineering, Computer Engineering, Computer Systems +17

1–5 of 381

Authors

1.2K

KR
Kaushik Roy
Purdue University West Lafayette, United States
11 publications · 1.3K citations
11
h-index
DS
Duane S. Boning
Massachusetts Institute of Technology, United States
10 publications · 481 citations
10
h-index
SN
Sani Nassif
IBM Research - Austin, United States
10 publications · 416 citations
10
h-index
LS
Li Shang
University of Colorado Boulder, United States
7 publications · 328 citations
7
h-index
SH
Shi‐Yu Huang
National Tsing Hua University, Taiwan
6 publications · 304 citations
6
h-index

1–5 of 1.2K

Institutions

358

1–8 of 358

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
15 publications · 581 citations
15
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
20 publications · 1.1K citations
14
h-index
IEEE Journal of Solid-State Circuits
9 publications · 989 citations
9
h-index
IEEE Transactions on Semiconductor Manufacturing
8 publications · 402 citations
8
h-index
IEEE Transactions on Electron Devices
6 publications · 146 citations
6
h-index

1–5