Nonideal Capacitance Effects

Nonideal Capacitance Effects is a theoretical construct in semiconductor device physics that characterizes deviations from ideal MOS capacitor behavior due to physical phenomena such as interface traps, oxide charges, and mobility degradation, which alter the capacitance-voltage relationship.

32

Publications

1.2K

Citations

104

Authors

49

Institutions

Publications per year

2017–2026

6

Authors

104

  1. MH
    Michael Hoffmann

    NaMLab (Germany), Germany

    2 publications · 169 citations

    2

    h-index

  2. TM
    Thomas Mikolajick

    NaMLab (Germany), Germany

    3 publications · 192 citations

    2

    h-index

  3. SS
    Stefan Slesazeck

    NaMLab (Germany), Germany

    2 publications · 169 citations

    2

    h-index

  4. AJ
    A. Jakubowski

    Virginia Tech, United States

    1 publications · 22 citations

    1

    h-index

  5. EH
    Eckart Hoene

    Fraunhofer Institute for Reliability and Microintegration, Germany

    1 publications · 35 citations

    1

    h-index

1–5 of 104

Venues

  1. IEEE Electron Device Letters

    3 publications · 203 citations

    3

    h-index

  2. IEEE Transactions on Electron Devices

    3 publications · 114 citations

    3

    h-index

  3. Sensors and Actuators B Chemical

    1 publications · 11 citations

    1

    h-index

  4. Journal of The Electrochemical Society

    JES · 1 publications · 27 citations

    1

    h-index

  5. Organic Electronics

    1 publications · 14 citations

    1

    h-index

1–5