Noise Parameter Extraction
Noise Parameter Extraction is a methodological procedure in microwave noise analysis that characterizes the stochastic behavior of semiconductor devices by determining their minimum noise figure, optimum source admittance, and noise resistance through measured or modeled scattering parameters, thereby enabling the prediction and optimization of noise performance in high-frequency circuits.
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11.1K
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2017–2026
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Sorin P. Voinigescu, M.C. Maliepaard, J.L. Showell et al. · IEEE Journal of Solid-State Circuits · 1997 · 337 citations · Full text
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National Radio Astronomy Observatory, United States
5 publications · 1.4K citations
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Centre National de la Recherche Scientifique
Paris, France
11 h-index
38 publications
1.3K citations

University of Palermo
Palermo, Italy
11 h-index
36 publications
946 citations
IBM (United States)
Armonk, United States
8 h-index
14 publications
712 citations

National Yang Ming Chiao Tung University
Hsinchu, Taiwan
6 h-index
12 publications
276 citations
National Radio Astronomy Observatory
Charlottesville, United States
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8 publications
1.4K citations

McMaster University
Hamilton, Canada
6 h-index
14 publications
579 citations
Nanyang Technological University
Singapore, Singapore
5 h-index
19 publications
389 citations

University of Messina
Messina, Italy
5 h-index
14 publications
455 citations
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