Noise Parameter Extraction

Noise Parameter Extraction is a methodological procedure in microwave noise analysis that characterizes the stochastic behavior of semiconductor devices by determining their minimum noise figure, optimum source admittance, and noise resistance through measured or modeled scattering parameters, thereby enabling the prediction and optimization of noise performance in high-frequency circuits.

272

Publications

11.1K

Citations

731

Authors

308

Institutions

Publications per year

2017–2026

20

Authors

731

  1. MS
    M. Sannino

    European Organization for Nuclear Research, Switzerland

    17 publications · 499 citations

    12

    h-index

  2. AC
    Alina Caddemi

    University of Messina, Italy

    11 publications · 255 citations

    10

    h-index

  3. GM
    G. Martines

    University of Palermo, Italy

    6 publications · 158 citations

    6

    h-index

  4. GN
    Guofu Niu

    Auburn University, United States

    6 publications · 134 citations

    6

    h-index

  5. MP
    M.W. Pospieszalski

    National Radio Astronomy Observatory, United States

    5 publications · 1.4K citations

    5

    h-index

1–5 of 731

Venues

  1. 31

    h-index

  2. 15

    h-index

  3. IEEE Transactions on Electron Devices

    13 publications · 632 citations

    12

    h-index

  4. Electronics Letters

    7 publications · 133 citations

    7

    h-index

  5. Microwave and Optical Technology Letters

    5 publications · 101 citations

    5

    h-index

1–5