Mask Data Preparation

Mask Data Preparation is a computational process in semiconductor manufacturing that transforms circuit design data into a precise, manufacturable format for photomask fabrication, distinguishing itself by incorporating resolution enhancement techniques, proximity correction, and data fracturing to ensure accurate pattern transfer onto silicon wafers.

22

Publications

455

Citations

84

Authors

31

Institutions

Publications per year

2017–2026

2

Authors

84

  1. IB
    Ingo Bork

    Siemens (United States), United States

    3 publications · 46 citations

    3

    h-index

  2. AF
    Aki Fujimura

    JEOL (Japan), Japan

    3 publications · 49 citations

    3

    h-index

  3. SI
    Soichi Inoue

    Toshiba (Japan), Japan

    2 publications · 33 citations

    2

    h-index

  4. SK
    Suigen Kyoh

    Toshiba (Japan), Japan

    2 publications · 33 citations

    2

    h-index

  5. TK
    Tadashi Komagata

    JEOL (Japan), Japan

    2 publications · 31 citations

    2

    h-index

1–5 of 84

Venues

  1. 11

    h-index

  2. 1

    h-index

  3. 1

    h-index

  4. Elektronika ir Elektrotechnika

    1 publications · 24 citations

    1

    h-index

  5. Journal of Micromechanics and Microengineering

    JMM · 1 publications · 28 citations

    1

    h-index

1–5