Interconnect Fault Analysis

Interconnect Fault Analysis is a diagnostic methodology within hardware debugging that identifies and characterizes defects in the physical or logical connections between components by analyzing signal integrity, continuity, and communication anomalies to distinguish faulty interconnects from other hardware failure modes.

118

Publications

3.6K

Citations

279

Authors

124

Institutions

Publications per year

2017–2026

Parents

Hardware Debugging

Publications

118

A new framework for analyzing test generation and diagnosis algorithms for wiring interconnects

N. Jarwala, C.W. Yau · 2003 · 169 citations

Engineering, Computer Engineering, Electrical Engineering +17

Built-in self-test of FPGA interconnect

Charles E. Stroud, Sajith Wijesuriya, C. Hamilton et al. · 2002 · 157 citations

Engineering, Computer Engineering, Electrical Engineering +17

A test methodology for interconnect structures of LUT-based FPGAs

Hiroyuki Michinishi, Tokumi Yokohira, Tatsuki Okamoto et al. · 2002 · 85 citations · Full text

Engineering, Computer Engineering, Computer Science +17

A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip

Érika Cota, Fernanda Lima Kastensmidt, Marcos Hervé · IEEE Transactions on Computers · 2008 · 80 citations · Full text

Engineering, Computer Engineering, Computer Systems +17

Backside localization of open and shorted IC interconnections

Edward I. Cole, Paiboon Tangyunyong, Daniel L. Barton · 1998 · 76 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

1–5 of 118

Authors

279

MB
Mehdi B. Tahoori
Karlsruhe Institute of Technology, Germany
12 publications · 311 citations
10
h-index
FL
Fabrizio Lombardi
Northeastern University, United States
7 publications · 159 citations
7
h-index
FL
Fernanda Lima Kastensmidt
Universidade Federal do Rio Grande do Sul, Brazil
5 publications · 177 citations
5
h-index
ÉC
Érika Cota
Universidade Federal do Rio Grande do Sul, Brazil
5 publications · 177 citations
5
h-index
BB
Bernd Becker
University of Freiburg, Germany
4 publications · 101 citations
4
h-index

1–5 of 279

Institutions

124

1–8 of 124

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
11 publications · 371 citations
11
h-index
Journal of Electronic Testing
JETTA · 5 publications · 95 citations
5
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
4 publications · 112 citations
4
h-index
IEEE Transactions on Semiconductor Manufacturing
3 publications · 54 citations
3
h-index
Microelectronics Reliability
2 publications · 70 citations
2
h-index

1–5