Concepedia

Input Pad Protection

Input Pad Protection is a circuit-level safeguarding technique in electrostatic discharge protection that specifically incorporates dedicated structures or devices at the input pad of an integrated circuit to divert transient electrostatic currents and limit voltage overshoot, thereby preventing damage to sensitive core components.

25

Publications

979

Citations

71

Authors

19

Institutions

Publications per year

2017–2026

2

Parents

Publications

25

A low-voltage triggering SCR for on-chip ESD protection at output and input pads

Amitava Chatterjee, T. Polgreen · IEEE Electron Device Letters · 1991 · 243 citations

, , +13

Broadband esd protection circuits in cmos technology

Shereen M. Galal, Behzad Razavi · IEEE Journal of Solid-State Circuits · 2003 · 147 citations

, , +14

Complementary-LVTSCR ESD protection circuit for submicron CMOS VLSI/ULSI

Ming-Dou Ker, Chung‐Yu Wu, Hun-Hsien Chang · IEEE Transactions on Electron Devices · 1996 · 67 citations

, , +9

A synthesis of ESD input protection scheme

Charvaka Duvvury, R.N. Rountree · Journal of Electrostatics · 1992 · 66 citations

, , +5

ESD protection design on analog pin with very low input capacitance for high-frequency or current-mode applications

Ming‐Dou Ker, Tung-Yang Chen, Chung‐Yu Wu et al. · IEEE Journal of Solid-State Circuits · 2000 · 60 citations

, , +13

1–5 of 25

Authors

71

  1. MK
    Ming‐Dou Ker

    National Yang Ming Chiao Tung University, Taiwan

    4 publications · 152 citations

    4

    h-index

  2. CW
    Chung‐Yu Wu

    National Yang Ming Chiao Tung University, Taiwan

    3 publications · 146 citations

    3

    h-index

  3. TP
    T. Polgreen

    Texas Instruments (United States), United States

    2 publications · 277 citations

    2

    h-index

  4. BR
    Behzad Razavi

    University of California, Los Angeles, United States

    2 publications · 183 citations

    2

    h-index

  5. AC
    Amitava Chatterjee

    Jadavpur University, India

    2 publications · 277 citations

    2

    h-index

1–5 of 71

Institutions

19

  1. National Yang Ming Chiao Tung University

    Hsinchu, Taiwan

    6 h-index

    13 publications

    579 citations

  2. Texas Instruments (United States)

    Dallas, United States

    4 h-index

    8 publications

    720 citations

  3. Taiwan Semiconductor Manufacturing Company (Taiwan)

    Hsinchu, Taiwan

    3 h-index

    13 publications

    236 citations

  4. Illinois Institute of Technology

    Chicago, United States

    2 h-index

    6 publications

    81 citations

  5. Industrial Technology Research Institute

    Hsinchu, Taiwan

    2 h-index

    2 publications

    40 citations

  6. University of California, Berkeley

    Berkeley, United States

    2 h-index

    4 publications

    64 citations

  7. DuPont (United States)

    Wilmington, United States

    1 h-index

    1 publications

    17 citations

  8. Centro de Estudios e Investigaciones Técnicas de Gipuzkoa

    San Sebastian, Spain

    1 h-index

    1 publications

    16 citations

1–8 of 19

Venues

  1. IEEE Journal of Solid-State Circuits

    4 publications · 278 citations

    4

    h-index

  2. IEEE Transactions on Electron Devices

    3 publications · 102 citations

    3

    h-index

  3. IEEE Electron Device Letters

    2 publications · 254 citations

    2

    h-index

  4. Reliability physics

    2 publications · 43 citations

    2

    h-index

  5. Journal of Electrostatics

    1 publications · 66 citations

    1

    h-index

1–5