Tung-Yang Chen

Investigation of the gate-driven effect and substrate-triggered effect on ESD robustness of CMOS devices

Tung-Yang Chen, Ming‐Dou Ker · IEEE Transactions on Device and Materials Reliability · 2001 · 89 citations

Electrical Engineering, Gate-driven Effect, Engineering +6

ESD protection design on analog pin with very low input capacitance for high-frequency or current-mode applications

Ming‐Dou Ker, Tung-Yang Chen, Chung‐Yu Wu et al. · IEEE Journal of Solid-State Circuits · 2000 · 59 citations

Electrical Engineering, Esd Protection Challenge, Engineering +8

Novel input ESD protection circuit with substrate-triggering technique in a 0.25-μm shallow-trench-isolation CMOS technology

Ming-Dou Ker, Tung-Yang Chen, Chung‐Yu Wu et al. · 2002 · 30 citations

Electrical Engineering, Engineering, Vlsi Design +6

Transient-Induced Latchup in CMOS ICs Under Electrical Fast-Transient Test

Cheng-Cheng Yen, Ming‐Dou Ker, Tung-Yang Chen · IEEE Transactions on Device and Materials Reliability · 2009 · 19 citations

Electrical Engineering, Engineering, Vlsi Design +9

Substrate-triggered ESD protection circuit without extra process modification

Ming-Dou Ker, Tung-Yang Chen · IEEE Journal of Solid-State Circuits · 2003 · 15 citations

Hardware Security, Electrical Engineering, Extra Process Modification +13