Fixed Oxide Charge

Fixed Oxide Charge is a type of immobile electric charge located at the interface between the silicon and silicon dioxide layers in a MOS capacitor, arising from excess silicon ions in the oxide lattice, which influences the threshold voltage by creating a fixed electrostatic field.

178

Publications

6.6K

Citations

611

Authors

196

Institutions

Publications per year

2017–2026

11

Variants

Fixed Oxide Charges

Authors

611

  1. PC
    Paul C. McIntyre

    Stanford University, United States

    6 publications · 240 citations

    6

    h-index

  2. PK
    Paul K. Hurley

    University College Cork, Ireland

    4 publications · 163 citations

    5

    h-index

  3. RA
    R. A. B. Devine

    Orange (France), France

    5 publications · 199 citations

    5

    h-index

  4. DW
    Dennis W. Hess

    Georgia Institute of Technology, United States

    4 publications · 68 citations

    4

    h-index

  5. KC
    K. Cherkaoui

    University College Cork, Ireland

    3 publications · 108 citations

    4

    h-index

1–5 of 611

Venues

  1. Journal of Applied Physics

    32 publications · 1.5K citations

    20

    h-index

  2. Applied Physics Letters

    20 publications · 955 citations

    16

    h-index

  3. Journal of The Electrochemical Society

    JES · 21 publications · 715 citations

    16

    h-index

  4. IEEE Electron Device Letters

    12 publications · 384 citations

    12

    h-index

  5. IEEE Transactions on Nuclear Science

    10 publications · 523 citations

    10

    h-index

1–5