Film Conformality

Film Conformality is a material deposition characteristic in chemical vapor deposition that denotes the uniformity of film thickness and coverage over complex, non-planar substrate topographies, distinguishing it from isotropic or directional deposition behaviors by its ability to replicate underlying surface features with minimal variation in thickness.

141

Publications

8.5K

Citations

580

Authors

165

Institutions

Publications per year

2017–2026

35

Authors

580

  1. MR
    Mikko Ritala

    University of Helsinki, Finland

    8 publications · 1.1K citations

    9

    h-index

  2. RL
    Riikka L. Puurunen

    VTT Technical Research Centre of Finland, Finland

    7 publications · 731 citations

    8

    h-index

  3. WM
    W. M. M. Kessels

    Eindhoven University of Technology, Netherlands

    8 publications · 710 citations

    8

    h-index

  4. ML
    Markku Leskelä

    University of Helsinki, Finland

    8 publications · 1.1K citations

    8

    h-index

  5. HC
    Harm C. M. Knoops

    Eindhoven University of Technology, Netherlands

    5 publications · 221 citations

    5

    h-index

1–5 of 580

Venues

  1. Journal of The Electrochemical Society

    JES · 16 publications · 1.1K citations

    16

    h-index

  2. 14

    h-index

  3. Chemistry of Materials

    9 publications · 583 citations

    9

    h-index

  4. Journal of Applied Physics

    6 publications · 286 citations

    6

    h-index

  5. Japanese Journal of Applied Physics

    JJAP · 6 publications · 114 citations

    6

    h-index

1–5