Film Conformality
Film Conformality is a material deposition characteristic in chemical vapor deposition that denotes the uniformity of film thickness and coverage over complex, non-planar substrate topographies, distinguishing it from isotropic or directional deposition behaviors by its ability to replicate underlying surface features with minimal variation in thickness.
141
Publications
8.5K
Citations
580
Authors
165
Institutions
Publications per year
2017–2026
35
Parents
141
580
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165

University of Helsinki
Helsinki, Finland
10 h-index
34 publications
3.5K citations
Eindhoven University of Technology
Eindhoven, The Netherlands
7 h-index
30 publications
2.5K citations
Aalto University
Espoo, Finland
6 h-index
7 publications
1.7K citations
University of Illinois Urbana-Champaign
Urbana, United States
6 h-index
20 publications
640 citations

VTT Technical Research Centre of Finland
Espoo, Finland
6 h-index
11 publications
1.9K citations

Ghent University
Ghent, Belgium
5 h-index
24 publications
3.4K citations
Arizona State University
Tempe, United States
5 h-index
18 publications
408 citations
Oxford Instruments (United Kingdom)
Abingdon, United Kingdom
5 h-index
5 publications
427 citations
1–8 of 165
JES · 16 publications · 1.1K citations
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15 publications · 596 citations
14
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9 publications · 583 citations
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6 publications · 286 citations
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JJAP · 6 publications · 114 citations
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