Error Mapping is a metrological method that identifies, characterizes, and spatially represents systematic deviations between measured and true geometric values across a measurement instrument’s operating range to enable compensation and traceability in length metrology.
66
Publications
3.5K
Citations
219
Authors
115
Institutions
Publications per year
2017–2026
24
Parents
Publications
66
Infants' Contribution to the Achievement of Joint Reference
Dare A. Baldwin · Child Development · 1991 · 862 citations
Infants' Contribution to the Achievement of Joint Reference
Dare A. Baldwin · Child Development · 1991 · 434 citations
1–5 of 66
Authors
219
- BL
3
h-index
- YS
3
h-index
- TS
3
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- AP
2
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- HS
2
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1–5 of 219
Institutions
115
Tianjin University
Tianjin, China
5 h-index
19 publications
930 citations
University of Huddersfield
Huddersfield, United Kingdom
3 h-index
8 publications
244 citations
Stanford University
Stanford, United States
3 h-index
5 publications
1.5K citations
National Physical Laboratory
London, United Kingdom
2 h-index
2 publications
261 citations
The University of Osaka
Osaka, Japan
2 h-index
4 publications
59 citations
Chinese University of Hong Kong
Hong Kong, Hong Kong
2 h-index
2 publications
44 citations
Dalian Maritime University
Dalian, China
2 h-index
6 publications
417 citations
Tsinghua University
Beijing, China
2 h-index
8 publications
432 citations
1–8 of 115
Venues
- CIRP Annals
5 publications · 298 citations
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- Precision Engineering
5 publications · 280 citations
5
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- IEEE Transactions on Instrumentation and Measurement
3 publications · 58 citations
3
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- The International Journal of Advanced Manufacturing Technology
2 publications · 30 citations
2
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- Journal of Geographical Systems
2 publications · 44 citations
2
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1–5