H. Schwenke - Concepedia

Author

H. Schwenke

L3S Research Center

Also Known As

A Prange, H Schwenke, H. SCHWENKE, H. Schwenke, Heinrich I. Schwenke, Heinrich Schwenke, Jatzkowski, Philipp

Publications

3.8K

Citations

H-Index

105

Concepts

All Affiliations

L3S Research Center Physikalisch-Technische Bundesanstalt Etalon (Germany)

About

H. Schwenke is an author at L3S Research Center specializing in engineering, spectroscopy, and x-ray spectroscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	24	38	3.3K
2	Education	10	10	1.6K
3	Medicine	9	9	479
4	Health Sciences	7	7	204
5	Natural Sciences	3	3	118

H. Schwenke

Publications

3.4K

Citations

H-Index

Page 1

	Year	Citations
Geometric error measurement and compensation of machines—An update H. Schwenke, Wolfgang Knapp, Han Haitjema, CIRP Annals EngineeringGeometric Error MeasurementMeasurementCalibrationComputer Engineering	2008	967
Optical Methods for Dimensional Metrology in Production Engineering H. Schwenke, Ulrich Neuschaefer-Rube, Tilo Pfeifer, CIRP Annals EngineeringMeasurementOptic DesignGeometrical OpticOptical Metrology	2002	295
Error mapping of CMMs and machine tools by a single tracking interferometer H. Schwenke, Matthias Franke, Jack F. Hannaford, CIRP Annals Sensor CalibrationSingle Tracking InterferometerEngineeringMeasurementCalibration	2005	237
Task Specific Uncertainty in Coordinate Measurement Robert G. Wilhelm, R.J. Hocken, H. Schwenke CIRP Annals EngineeringMeasurementUncertainty QuantificationCalibrationSpatial Uncertainty	2001	202
On-the-fly calibration of linear and rotary axes of machine tools and CMMs using a tracking interferometer H. Schwenke, Robert Schmitt, Philipp Jatzkowski, CIRP Annals Sensor CalibrationEngineeringMeasurementCalibrationTracking Interferometer	2009	151
Productive Metrology - Adding Value to Manufacture H. Kunzmann, Tilo Pfeifer, Robert Schmitt, CIRP Annals Industrial DesignEngineeringProduction TechnologyMeasurementIndustrial Engineering	2005	129
An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level J. Knoth, H. Schwenke Fresenius Zeitschrift für Analytische Chemie X-ray Fluorescence SpectrometerX-ray SpectroscopySample SupportEngineeringAnalytical Instrumentation	1978	126
Assessment of Uncertainties in Dimensional Metrology by Monte Carlo Simulation: Proposal of a Modular and Visual Software H. Schwenke, Bernd Siebert, F. Wäldele, CIRP Annals EngineeringMeasurementSpatial UncertaintyMonte Carlo MethodsSimulation	2000	106
Opto-tactile Sensor for 2D and 3D Measurement of Small Structures on Coordinate Measuring Machines H. Schwenke, F. Wäldele, Ch. Weiskirch, CIRP Annals Tactile SensingEngineeringSoft RoboticsMeasurementMechanical Engineering	2001	101
Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis U. Weisbrod, R. Gutschke, J. Knoth, Applied Physics A Materials ScienceQuantitative SurfaceX-ray SpectroscopyEngineeringMicroscopy	1991	93

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