David C. Ferranti - Concepedia

Author

David C. Ferranti

Carl Zeiss (United States)

Also Known As

D Ferranti, D. Ferranti, David C Ferranti, David C. Ferranti, David Ferranti

Publications

662

Citations

H-Index

Concepts

All Affiliations

Carl Zeiss (United States)Carl Zeiss (Germany)

About

David C. Ferranti is an author at Carl Zeiss (United States) specializing in engineering, applied physics, and nanotechnology.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	387
2	Applied Physics	6	6	351
3	Materials Science	2	2	59
4	Medicine	1	1	197
5	Electrical Engineering	1	1	67

David C. Ferranti

Publications

556

Citations

H-Index

Page 1

	Year	Citations
Rapid and precise scanning helium ion microscope milling of solid-state nanopores for biomolecule detection Jijin Yang, David C. Ferranti, Lewis Stern, Nanotechnology EngineeringMicroscopyNanopore DimensionsDna NanotechnologySolid-state Nanopores	2011	197
Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution Matthew S. Joens, Chuong Huynh, James M. Kasuboski, Scientific Reports	2013	156
Focused helium ion beam deposited low resistivity cobalt metal lines with 10 nm resolution: implications for advanced circuit editing Huimeng Wu, Lewis Stern, Deying Xia, Journal of Materials Science Materials in Electronics Electrical EngineeringIon ImplantationEngineeringNm ResolutionPhysics	2013	67
Fabrication and initial characterization of ultrahigh aspect ratio vias in gold using the helium ion microscope Larry Scipioni, David C. Ferranti, Vincent S. Smentkowski, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena EngineeringMicroscopyMechanical EngineeringBeam LithographySmall Size	2010	46
Performance of multicusp plasma ion source for focused ion beam applications Larry Scipioni, Diane K. Stewart, David C. Ferranti, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Ion ImplantationEngineeringMicroscopyOptical DiagnosticsIon Projection Lithography	2000	36
Precise nanofabrication with multiple ion beams for advanced circuit edit Huimeng Wu, David C. Ferranti, Lewis Stern Microelectronics Reliability Ion ImplantationEngineeringElectron-beam LithographyPhysicsMicrofabrication	2014	15
Creating nanohole arrays with the helium ion microscope M.V. Ananth, Lewis Stern, David C. Ferranti, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Materials ScienceIon ImplantationEngineeringPhysicsMicrofabrication	2011	13
Resolution Limits of Secondary Electron Dopant Contrast in Helium Ion and Scanning Electron Microscopy Mark A. Jepson, Xiong Liu, David C. Bell, Microscopy and Microanalysis	2011	13
Advanced Nanofabrication using Helium, Neon and Gallium Ion Beams in the Carl Zeiss Orion NanoFab Microscope D. Elswick, M.V. Ananth, Lewis Stern, Microscopy and Microanalysis Gallium Ion BeamsEngineeringElectron MicroscopyPhysicsMicroscopy	2013	13

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