Publication | Closed Access
Focused helium ion beam deposited low resistivity cobalt metal lines with 10 nm resolution: implications for advanced circuit editing
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Citations
43
References
2013
Year
Electrical EngineeringIon ImplantationEngineeringNm ResolutionPhysicsElectron-beam LithographyApplied PhysicsIon BeamIon EmissionMicroelectronicsAdvanced Circuit
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