Statistics
Publications
46
Citations
1.2K
H-Index
19
Active since
1981
C.T. Chuang is an author at IBM Research - Thomas J. Watson Research Center specializing in engineering, microelectronics, and electrical engineering.
Publications per year
1981–2008
46
46
The impact of gate-oxide breakdown on SRAM stability
R. Rodrı́guez, J. H. Stathis, B.P. Linder et al. · IEEE Electron Device Letters · 2002 · 128 citations
Engineering, Computer Engineering, Electrical Engineering +17
A submicrometer high-performance bipolar technology
T.-C. Chen, K.-Y. Toh, John D. Cressler et al. · IEEE Electron Device Letters · 1989 · 41 citations
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