R. B. Gregory

Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry

Thomas E. Tiwald, John A. Woollam, Stefan Zollner et al. · Physical review. B, Condensed matter · 1999 · 163 citations

Optical Materials, Engineering, Spectroscopic Property +22

Effects of anneal ambients and Pt thickness on Pt/Ti and Pt/Ti/TiN interfacial reactions

J. O. Olowolafe, Robert E. Jones, A. C. Campbell et al. · Journal of Applied Physics · 1993 · 141 citations

Engineering, Thin Film Process Technology, Chemistry +20

Interdiffusions in Cu/reactive-ion-sputtered TiN, Cu/chemical-vapor-deposited TiN, Cu/TaN, and TaN/Cu/TaN thin-film structures: Low temperature diffusion analyses

J. O. Olowolafe, C. J. Mogab, R. B. Gregory et al. · Journal of Applied Physics · 1992 · 114 citations

Characterization of sputtered barium strontium titanate and strontium titanate-thin films

B. A. Baumert, L.-H. Chang, Atsushi Matsuda et al. · Journal of Applied Physics · 1997 · 106 citations

Materials Science, Materials Engineering, Electrical Engineering +13

Quantum confinement effects in strained silicon-germanium alloy quantum wells

X. Xiao, C. W. Liu, James C. Sturm et al. · Applied Physics Letters · 1992 · 69 citations

Engineering, Optoelectronic Devices, Semiconductor Nanostructures +18