Concepedia

J. O. Olowolafe

JO

Statistics

Publications

35

Citations

1.9K

H-Index

22

Active since

1975

Affiliations

University of Delaware(Current)

Cornell University

Motorola (United States)

California Institute of Technology

IBM Research - Thomas J. Watson Research Center

J. O. Olowolafe is an author at University of Delaware specializing in materials science, materials engineering, and natural sciences.

Publications per year

1975–2004

35

Publications

35

Electrical conduction and dielectric breakdown in aluminum oxide insulators on silicon

J. Kolodzey, Enam Chowdhury, Thomas Adam et al. · IEEE Transactions on Electron Devices · 2000 · 202 citations

Engineering, Materials Engineering, Materials Science +17

Influence of the nature of the Si substrate on nickel silicide formed from thin Ni films

J. O. Olowolafe, M.−A. Nicolet, J. W. Mayer · Thin Solid Films · 1976 · 177 citations

Engineering, Materials Engineering, Materials Science +13

Effects of anneal ambients and Pt thickness on Pt/Ti and Pt/Ti/TiN interfacial reactions

J. O. Olowolafe, Robert E. Jones, A. C. Campbell et al. · Journal of Applied Physics · 1993 · 141 citations

Natural Sciences, Materials Engineering, Materials Science +12

Iron silicide thin film formation at low temperatures

S.S. Lau, Jie Feng, J. O. Olowolafe et al. · Thin Solid Films · 1975 · 118 citations

Natural Sciences, Materials Engineering, Materials Science +12

Band gap bowing and refractive index spectra of polycrystalline AlxIn1−xN films deposited by sputtering

Joachim Piprek, Guohua Qiu, J. O. Olowolafe et al. · Applied Physics Letters · 1997 · 115 citations

Natural Sciences, Materials Engineering, Materials Science +17

1–5 of 35