In‐Shik Han - Concepedia

Author

In‐Shik Han

Also Known As

Han, In-Shik;Ji, Hee-Hwan;Goo, Tae-Gyu;You, Ook-Sang;Choi, Won-Ho;Park, Sung-Hyung;Lee, Heui-Seung;Kang, Young-Seok;Kim, Dae-Byung;Lee, Hi-Deok;, In-Shik Han, In‐Shik Han

Publications

235

Citations

H-Index

Concepts

All Affiliations

Chungnam National University MagnaChip (South Korea)

About

In‐Shik Han is an author at Chungnam National University specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	137
2	Electrical Engineering	8	8	137
3	Applied Physics	7	7	118
4	Materials Science	2	2	32
5	Physics	2	2	31

In‐Shik Han

Publications

147

Citations

H-Index

Page 1

	Year	Citations
Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High-$k$ Dielectric/Metal Gate Hyuk-Min Kwon, In‐Shik Han, Jung-Deuk Bok, IEEE Electron Device Letters Dielectric/metal GateElectrical EngineeringSub XmlnsEngineeringHigh-performance P-mosfets	2011	33
Instability dependent upon bias and temperature stress in amorphous‐indium gallium zinc oxide (a‐IGZO) thin‐film transistors Kwang‐Il Choi, Dong‐Ho Nam, Jeong‐Gyu Park, Journal of the Society for Information Display EngineeringThin Film Process TechnologySemiconductor DeviceElectronic DevicesThin‐film Transistors	2009	19
Analysis of reliability characteristics of high capacitance density MIM capacitors with SiO2–HfO2–SiO2 dielectrics Sang-Uk Park, Chang-Yong Kang, Hyuk-Min Kwon, Microelectronic Engineering Electrical EngineeringEngineeringSio2–hfo2–sio2 DielectricsReliability CharacteristicsDevice Reliability	2010	19
Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs Sung-Kyu Kwon, Hyuk-Min Kwon, In‐Shik Han, IEEE Journal of the Electron Devices Society EngineeringFluorine Implantation EnergyFlicker NoiseSemiconductor DeviceRf Semiconductor	2018	18
Thermal Immune NiGermanide for High Performance Ge MOSFETs on Ge-on- Si Substrate Utilizing $ \hbox{Ni}_{0.95}\hbox{Pd}_{0.05}$ Alloy Yingying Zhang, Jungwoo Oh, In‐Shik Han, IEEE Transactions on Electron Devices Materials ScienceSemiconductorsElectrical EngineeringElectronic DevicesGe Mosfets	2009	13
Effects of High-Pressure Annealing on Random Telegraph Signal Noise Characteristic of Source Follower Block in CMOS Image Sensor Hyuk-Min Kwon, In‐Shik Han, Sung-Kyu Kwon, IEEE Electron Device Letters Electrical EngineeringEngineeringPhysicsBias Temperature InstabilityApplied Physics	2013	13
Carrier transport mechanism in La-incorporated high-k dielectric/metal gate stack MOSFETs Hyuk-Min Kwon, Won‐Ho Choi, In‐Shik Han, Microelectronic Engineering Electrical EngineeringEngineeringCarrier Transport MechanismElectronic EngineeringApplied Physics	2010	12
Effect of source/drain overlap region on device performance in a‐IGZO thin‐film transistors Dong‐Ho Nam, Kwang‐Il Choi, Sungsoo Park, Journal of the Society for Information Display	2009	10
New Observation of Mobility and Reliability Dependence on Mechanical Film Stress in Strained Silicon CMOSFETs In‐Shik Han, Hee-Hwan Ji, Ook-Sang You, IEEE Transactions on Electron Devices Strained Silicon CmosfetsEngineeringReliability CharacteristicsIntegrated CircuitsSilicon On Insulator	2008	10

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