Sung-Kyu Kwon

Characterization of Al2O3–HfO2–Al2O3 sandwiched MIM capacitor under DC and AC stresses

Ho‐Young Kwak, Hyuk-Min Kwon, Yi-Jung Jung et al. · Solid-State Electronics · 2012 · 27 citations

Materials Science, Engineering, Mim Capacitor +2

Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs

Sung-Kyu Kwon, Hyuk-Min Kwon, In‐Shik Han et al. · IEEE Journal of the Electron Devices Society · 2018 · 18 citations · Full text

Engineering, Fluorine Implantation Energy, Flicker Noise +16

A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor

Hyuk-Min Kwon, Sung-Kyu Kwon, Kwang-Seok Jeong et al. · IEEE Transactions on Electron Devices · 2014 · 17 citations

Dielectrics, Engineering, Reliability Characteristics +17

Effects of High-Pressure Annealing on Random Telegraph Signal Noise Characteristic of Source Follower Block in CMOS Image Sensor

Hyuk-Min Kwon, In‐Shik Han, Sung-Kyu Kwon et al. · IEEE Electron Device Letters · 2013 · 13 citations

Electrical Engineering, Engineering, Physics +12

Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology

Seong-Yong Jang, Sung-Kyu Kwon, Jong-Kwan Shin et al. · JSTS Journal of Semiconductor Technology and Science · 2015 · 12 citations

Electrical Engineering, Engineering, Radio Frequency +10