Chang-Yong Kang

Metal gate-HfO/sub 2/ MOS structures on GaAs substrate with and without Si interlayer

Hyoung-sub Kim, Manhong Zhang, Chang-Yong Kang et al. · IEEE Electron Device Letters · 2006 · 81 citations

Engineering, Electrical Engineering, Materials Science +17

Aggressively scaled ultra thin undoped HfO/sub 2/ gate dielectric (EOT<0.7 nm) with TaN gate electrode using engineered interface layer

Chang‐Hwan Choi, Chang-Yong Kang, Se Jong Rhee et al. · IEEE Electron Device Letters · 2005 · 28 citations

Engineering, Materials Engineering, Materials Science +17

Stress field analysis to understand the breakdown characteristics of stacked high-k dielectrics

Byoung Hun Lee, Chang-Yong Kang, Rino Choi et al. · Applied Physics Letters · 2009 · 21 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Analysis of reliability characteristics of high capacitance density MIM capacitors with SiO2–HfO2–SiO2 dielectrics

Sang-Uk Park, Chang-Yong Kang, Hyuk-Min Kwon et al. · Microelectronic Engineering · 2010 · 19 citations

Engineering, Materials Engineering, Materials Science +14