Z. U. Rek - Concepedia

Author

Z. U. Rek

Stanford Synchrotron Radiation Lightsource

Also Known As

Rek, Z., Z Rek, Z U Rek, Z. Rek, Z. U. Rek, Z.U Rek, Z.U. Rek, Zofia Rek, Zofia U. Rek

106

Publications

1.5K

Citations

H-Index

Concepts

All Affiliations

Stanford Synchrotron Radiation Lightsource Stanford University University of Michigan National Institute for Materials Science Lawrence Livermore National Laboratory

About

Z. U. Rek is an author at Stanford Synchrotron Radiation Lightsource specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	21	30	1.2K
2	Applied Physics	19	27	1.1K
3	Natural Sciences	4	4	171
4	Health Sciences	3	3	129
5	Biomedical Engineering	1	1	52

Z. U. Rek

Publications

1.4K

Citations

H-Index

Page 1

	Year	Citations
Stoichiometry-related defects in GaAs grown by molecular-beam epitaxy at low temperatures M. Kamińska, E. R. Weber, Z. Liliental‐Weber, Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena EngineeringSemiconductorsMolecular-beam EpitaxyQuantum MaterialsMolecular Beam Epitaxy	1989	207
An energy-dispersive spectrometer for the rapid measurement of X-ray absorption spectra using synchrotron radiation R. P. Phizackerley, Z. U. Rek, G. B. Stephenson, Journal of Applied Crystallography X-ray FilmBent Triangular CrystalX-ray SpectroscopyEngineeringChemistry	1983	77
Defect-selective etching of bulk AlN single crystals in molten KOH/NaOH eutectic alloy Danping Zhuang, James H. Edgar, B. Strojek, Journal of Crystal Growth Materials EngineeringMaterials ScienceAluminium NitrideEngineeringApplied Physics	2003	74
Influence of process-induced stress on device characteristics and its impact on scaled device performance P. Smeys, Peter B. Griffin, Z. U. Rek, IEEE Transactions on Electron Devices Wide-bandgap SemiconductorEngineeringProcess-induced StressSemiconductor DeviceDevice Pitch	1999	68
New opportunities in XAFS investigation in the 1–2 keV region Joe Wong, Graham N. George, Ingrid J. Pickering, Solid State Communications EngineeringNew Opportunities	1994	68
Analysis of thin film stress measurement techniques S. G. Malhotra, Z. U. Rek, S. M. Yalisove, Thin Solid Films EngineeringStressstrain AnalysisSolid MechanicsResidual StressElectronic Packaging	1997	65
Sources of optical distortion in rapidly grown crystals of KH2PO4 James J. De Yoreo, Z. U. Rek, Natalia Zaitseva, Journal of Crystal Growth Materials SciencePhotonicsOptical MaterialsEngineeringCrystal Material	1996	58
YB<sub>66</sub>– a new soft X-ray monochromator for synchrotron radiation. II. Characterization Joe Wong, T. Tanaka, M. Rowen, Journal of Synchrotron Radiation X-ray CrystallographyOptical MaterialsX-ray SpectroscopyEngineeringSharp Reflectivity Increases	1999	54
YB66: A new soft-X-ray monochromator for synchrotron radiation Joe Wong, G. Shimkaveg, W. H. Goldstein, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment X-ray ImagingSynchrotron RadiationRadiation ImagingSynchrotron Radiation SourceX-ray Optic	1990	53
A Wide-Bandpass Multilayer Monochromator for Biological Small-Angle Scattering and Fiber Diffraction Studies Hiro Tsuruta, S. Brennan, Z. U. Rek, Journal of Applied Crystallography X-ray CrystallographyBiological Small-angle ScatteringDiffraction PeaksEngineeringMultilayer Beam	1998	52

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