P. Smeys

Influence of process-induced stress on device characteristics and its impact on scaled device performance

P. Smeys, Peter B. Griffin, Z. U. Rek et al. · IEEE Transactions on Electron Devices · 1999 · 68 citations

Engineering, Electrical Engineering, Materials Science +17

High-performance sub-0.08 μm CMOS with dual gate oxide and 9.7 ps inverter delay

M. Hargrove, S. Crowder, E. Nowak et al. · 2002 · 46 citations

Engineering, Electrical Engineering, Microelectronics +15

A 0.13-μm SOI CMOS technology for low-power digital and RF applications

N. Zamdmer, A. Ray, Jean‐Olivier Plouchart et al. · 2002 · 40 citations

Engineering, Computer Engineering, Electrical Engineering +17

Analysis of Integrated Solenoid Inductor With Closed Magnetic Core

Joyce M. Wright, Dok Won Lee, Anuraag Mohan et al. · IEEE Transactions on Magnetics · 2010 · 28 citations

Natural Sciences, Electrical Engineering, Materials Science +15

A high performance 0.13 μm SOI CMOS technology with Cu interconnects and low-k BEOL dielectric

P. Smeys, V. McGahay, Insoon Yang et al. · 2002 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +17