S. Crowder

Dual stress liner for high performance sub-45nm gate length SOI CMOS manufacturing

Haining Yang, R. Malik, Y. Li et al. · 2005 · 142 citations

Engineering, Electrical Engineering, Manufacturing Engineering +11

Species and dose dependence of ion implantation damage induced transient enhanced diffusion

H. S. Chao, S. Crowder, Peter B. Griffin et al. · Journal of Applied Physics · 1996 · 81 citations

Engineering, Materials Engineering, Materials Science +17

Dose loss in phosphorus implants due to transient diffusion and interface segregation

Peter B. Griffin, S. Crowder, John M. Knight · Applied Physics Letters · 1995 · 66 citations

Engineering, Materials Engineering, Materials Science +15

Software defined environments: An introduction

C.-S. Li, B. L. Brech, S. Crowder et al. · IBM Journal of Research and Development · 2014 · 64 citations

Computing, Cloud Computing, Computer Science +14

High-performance sub-0.08 μm CMOS with dual gate oxide and 9.7 ps inverter delay

M. Hargrove, S. Crowder, E. Nowak et al. · 2002 · 46 citations

Engineering, Electrical Engineering, Microelectronics +15