B. E. White

Fermi-Level Pinning at the Polysilicon/Metal Oxide Interface—Part I

C. C. Hobbs, L. R. C. Fonseca, A. A. Knizhnik et al. · IEEE Transactions on Electron Devices · 2004 · 224 citations

Electrical Engineering, Engineering, Physics +13

Contributions to the effective work function of platinum on hafnium dioxide

J. Schaeffer, L. R. C. Fonseca, S. Samavedam et al. · Applied Physics Letters · 2004 · 194 citations

Materials Science, Electrical Engineering, Engineering +12

Fermi-Level Pinning at the Polysilicon/Metal–Oxide Interface—Part II

C. C. Hobbs, L. R. C. Fonseca, A. A. Knizhnik et al. · IEEE Transactions on Electron Devices · 2004 · 174 citations

Materials Science, Electrical Engineering, Semiconductor Device +14

Impact of Deposition and Annealing Temperature on Material and Electrical Characteristics of ALD HfO[sub 2]

Dina H. Triyoso, R. Liu, D. Roan et al. · Journal of The Electrochemical Society · 2004 · 165 citations

Aluminium Nitride, Engineering, Thin Film Process Technology +18

Amorphous Solid without Low Energy Excitations

Xiao Liu, B. E. White, R. O. Pohl et al. · Physical Review Letters · 1997 · 161 citations

Materials Science, Controlled Densities, Engineering +15