Dina H. Triyoso

Fermi-Level Pinning at the Polysilicon/Metal Oxide Interface—Part I

C. C. Hobbs, L. R. C. Fonseca, A. A. Knizhnik et al. · IEEE Transactions on Electron Devices · 2004 · 224 citations

Electrical Engineering, Engineering, Physics +13

Fermi-Level Pinning at the Polysilicon/Metal–Oxide Interface—Part II

C. C. Hobbs, L. R. C. Fonseca, A. A. Knizhnik et al. · IEEE Transactions on Electron Devices · 2004 · 174 citations

Materials Science, Electrical Engineering, Semiconductor Device +14

Impact of Deposition and Annealing Temperature on Material and Electrical Characteristics of ALD HfO[sub 2]

Dina H. Triyoso, R. Liu, D. Roan et al. · Journal of The Electrochemical Society · 2004 · 165 citations

Aluminium Nitride, Engineering, Thin Film Process Technology +18

Crystallization in hafnia‐ and zirconia‐based systems

Sergey V. Ushakov, Alexandra Navrotsky, Yingju Yang et al. · physica status solidi (b) · 2004 · 162 citations

Materials Science, Materials Engineering, High Temperature Materials +12

Fermi level pinning at the polySi/metal oxide interface

Chris Hobbs, L.M. Fonseca, V. Dhandapani et al. · 2004 · 111 citations

Engineering, Silicon On Insulator, Semiconductor Device +16