R.S. Balmer

Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy

Martin Kuball, Joseph M. Hayes, Michael J. Uren et al. · IEEE Electron Device Letters · 2002 · 348 citations

Engineering, Electrical Engineering, Materials Science +17

Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures

Andrei Sarua, Hangfeng Ji, Martin Kuball et al. · IEEE Transactions on Electron Devices · 2006 · 260 citations

Engineering, Materials Engineering, Materials Science +17

Punch-through in short-channel AlGaN/GaN HFETs

Michael J. Uren, K. J. Nash, R.S. Balmer et al. · IEEE Transactions on Electron Devices · 2006 · 220 citations

Engineering, Electrical Engineering, Materials Science +15

Measurement of temperature distribution in multifinger AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy

Martin Kuball, S. Rajasingam, Andrei Sarua et al. · Applied Physics Letters · 2003 · 183 citations

Engineering, Electrical Engineering, Materials Science +17

High temperature performance of AlGaN/GaN HEMTs on Si substrates

W. S. Tan, Michael J. Uren, P. W. Fry et al. · Solid-State Electronics · 2006 · 120 citations

Engineering, Electrical Engineering, Materials Science +16