S. Rajasingam

Measurement of temperature distribution in multifinger AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy

Martin Kuball, S. Rajasingam, Andrei Sarua et al. · Applied Physics Letters · 2003 · 183 citations

Engineering, Electrical Engineering, Materials Science +17

Micro-Raman Temperature Measurements for Electric Field Assessment in Active AlGaN–GaN HFETs

S. Rajasingam, James W. Pomeroy, Martin Kuball et al. · IEEE Electron Device Letters · 2004 · 98 citations

Engineering, Electrical Engineering, Materials Science +15

Bulk AlN crystal growth: self-seeding and seeding on 6H-SiC substrates

James H. Edgar, L. Liu, B. Liu et al. · Journal of Crystal Growth · 2002 · 78 citations

Natural Sciences, Materials Engineering, Materials Science +14

Raman characterization and stress analysis of AlN grown on SiC by sublimation

L. Liu, B. Liu, James H. Edgar et al. · Journal of Applied Physics · 2002 · 58 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

High spatial resolution micro‐Raman temperature measurements of nitride devices (FETs and light emitters)

Martin Kuball, James W. Pomeroy, S. Rajasingam et al. · physica status solidi (a) · 2005 · 25 citations

Engineering, Materials Engineering, Materials Science +17