D. Reid

Advanced simulation of statistical variability and reliability in nano CMOS transistors

Asen Asenov, S. Roy, Richard Brown et al. · 2008 · 36 citations · Full text

Engineering, Electrical Engineering, Physics +17

Hot carrier aging and its variation under use-bias: Kinetics, prediction, impact on Vdd and SRAM

Meng Duan, J. F. Zhang, Azrif Manut et al. · 2015 · 24 citations · Full text

Engineering, Computer Engineering, Aging +14

Simulation based transistor-SRAM co-design in the presence of statistical variability and reliability

Asen Asenov, B. Cheng, Xingsheng Wang et al. · 2013 · 20 citations

Engineering, Computer Engineering, Electrical Engineering +17

Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology

Louis Gerrer, C. Millar, A. Asenov et al. · 2013 · 20 citations

Engineering, Electrical Engineering, Physics +17

Combining process and statistical variability in the evaluation of the effectiveness of corners in digital circuit parametric yield analysis

P. Asenov, Noor Ain Kamsani, D. Reid et al. · 2010 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +17