Concepedia

Patrick Justison

PJ

Statistics

Publications

17

Citations

555

H-Index

15

Active since

2000

Affiliations

GlobalFoundries (United States)(Current)

The University of Texas at Austin

GlobalFoundries (Germany)

IBM (United States)

Patrick Justison is an author at GlobalFoundries (United States) specializing in engineering, electrical engineering, and semiconductor reliability.

Publications per year

2000–2018

17

Publications

17

Electromigration critical length effect in Cu/oxide dual-damascene interconnects

Ki-Don Lee, Ennis T. Ogawa, Hideki Matsuhashi et al. · Applied Physics Letters · 2001 · 86 citations

, , +17

Direct observation of a critical length effect in dual-damascene Cu/oxide interconnects

Ennis T. Ogawa, Alexander J. Bierwag, Ki-Don Lee et al. · Applied Physics Letters · 2001 · 68 citations

, , +17

A 7nm CMOS technology platform for mobile and high performance compute application

B. Jagannathan, Akihisa Ogino, D. Jaeger et al. · 2017 · 60 citations

, , +14

Statistics of electromigration early failures in Cu/oxide dual-damascene interconnects

E.T. Ogawa, K.-D. Lee, Hideki Matsuhashi et al. · 2002 · 51 citations

, , +17

Statistical analysis of electromigration lifetimes and void evolution

Meike Hauschildt, M. Gall, S. Thrasher et al. · Journal of Applied Physics · 2007 · 42 citations

, , +17

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