Concepedia

M. Gall

MG

Statistics

Publications

14

Citations

349

H-Index

12

Active since

1997

Affiliations

The University of Texas at Austin(Current)

Motorola (United States)

Siemens (United States)

IBM (United States)

Toshiba (United States)

M. Gall is an author at The University of Texas at Austin specializing in electrical engineering, engineering, and microelectronics.

Publications per year

1997–2021

14

Publications

14

Statistical analysis of early failures in electromigration

M. Gall, C. Capasso, D. Jawarani et al. · Journal of Applied Physics · 2001 · 63 citations

Engineering, Electrical Engineering, Materials Science +17

Electromigration early failure void nucleation and growth phenomena in Cu and Cu(Mn) interconnects

Meike Hauschildt, C. Hennesthal, G. Talut et al. · 2013 · 52 citations

Engineering, Electrical Engineering, Materials Science +17

Statistical analysis of electromigration lifetimes and void evolution

Meike Hauschildt, M. Gall, S. Thrasher et al. · Journal of Applied Physics · 2007 · 42 citations

Engineering, Electrical Engineering, Materials Science +17

A fully planarized 0.25 μm CMOS technology for 256 Mbit DRAM and beyond

G. Bronner, H. Aochi, M. Gall et al. · 2002 · 25 citations

Engineering, Electrical Engineering, Microelectronics +16

Analysis of electromigration statistics for Cu interconnects

Meike Hauschildt, M. Gall, S. Thrasher et al. · Applied Physics Letters · 2006 · 24 citations

Engineering, Electrical Engineering, Materials Engineering +17

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