Statistics
Publications
27
Citations
961
H-Index
19
Active since
1984
S. A. Cohen is an author at IBM Research - Thomas J. Watson Research Center specializing in materials science, materials engineering, and electronic materials.
Publications per year
1984–2017
27
27
Gate oxide breakdown under Current Limited Constant Voltage Stress
B.P. Linder, J. H. Stathis, R. Wachnik et al. · 2002 · 83 citations
1–5 of 27