E. Todd Ryan

Low Dielectric Constant Materials for ULSI Interconnects

Michael Morgen, E. Todd Ryan, Jie-Hua Zhao et al. · Annual Review of Materials Science · 2000 · 387 citations

Engineering, Electrical Engineering, Materials Engineering +17

Positronium annihilation in mesoporous thin films

David W. Gidley, W. E. Frieze, T. L. Dull et al. · Physical review. B, Condensed matter · 1999 · 275 citations

Natural Sciences, Materials Science, Physics +17

Mechanical and Dielectric Properties of Pure‐Silica‐Zeolite Low‐<i>k</i> Materials

Zijian Li, Mark Johnson, Minwei Sun et al. · Angewandte Chemie International Edition · 2006 · 146 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Properties of nanoporous silica thin films determined by high-resolution x-ray reflectivity and small-angle neutron scattering

Wen‐Li Wu, W.E. Wallace, Eric K. Lin et al. · Journal of Applied Physics · 2000 · 137 citations

Natural Sciences, Materials Engineering, Materials Science +17

Absorption and Fluorescence Studies of Acridine in Subcritical and Supercritical Water

E. Todd Ryan, Tao Xiang, Keith P. Johnston et al. · The Journal of Physical Chemistry A · 1997 · 92 citations

Natural Sciences, Chemistry, Analytical Chemistry +16