E. Todd Ryan

Low Dielectric Constant Materials for ULSI Interconnects

Michael Morgen, E. Todd Ryan, Jie-Hua Zhao et al. · Annual Review of Materials Science · 2000 · 385 citations

Engineering, Integrated Circuits, Ulsi Interconnects +16

Positronium annihilation in mesoporous thin films

David W. Gidley, W. E. Frieze, T. L. Dull et al. · Physical review. B, Condensed matter · 1999 · 275 citations

Engineering, Nanoporous Material, Positron Annihilation Spectroscopy +17

Mechanical and Dielectric Properties of Pure‐Silica‐Zeolite Low‐<i>k</i> Materials

Zijian Li, Mark Johnson, Minwei Sun et al. · Angewandte Chemie International Edition · 2006 · 145 citations · Full text

Materials Science, Materials Engineering, Dielectric Properties +14

Properties of nanoporous silica thin films determined by high-resolution x-ray reflectivity and small-angle neutron scattering

Wen‐Li Wu, W.E. Wallace, Eric K. Lin et al. · Journal of Applied Physics · 2000 · 137 citations

Engineering, Nanoporous Material, Thin Film Process Technology +16

Absorption and Fluorescence Studies of Acridine in Subcritical and Supercritical Water

E. Todd Ryan, Tao Xiang, Keith P. Johnston et al. · The Journal of Physical Chemistry A · 1997 · 90 citations

Engineering, Supercritical Fluid Chromatography, Chemistry +20