Ho‐Jin Yun

Investigation of zinc interstitial ions as the origin of anomalous stress-induced hump in amorphous indium gallium zinc oxide thin film transistors

Yu-Mi Kim, Kwang‐Seok Jeong, Ho‐Jin Yun et al. · Applied Physics Letters · 2013 · 40 citations

Materials Science, Anomalous Hump, Electrical Engineering +15

Dual etch processes of via and metal paste filling for through silicon via process

Yong-Hyun Ham, Dong‐Pyo Kim, Kun-Sik Park et al. · Thin Solid Films · 2011 · 25 citations

Materials Science, Materials Engineering, Metal Paste Filling +11

Crystal Quality Effect on Low-Frequency Noise in ZnO TFTs

Kwang‐Seok Jeong, Yu-Mi Kim, Ho‐Jin Yun et al. · IEEE Electron Device Letters · 2011 · 22 citations

Electrical Engineering, Zno Tfts, Engineering +12

Investigation of atomic-layer-deposited Al-doped ZnO film for AZO/ZnO double-stacked active layer thin-film transistor application

Jun-Kyo Jeong, Ho‐Jin Yun, Seung‐Dong Yang et al. · Thin Solid Films · 2017 · 22 citations

Materials Science, Materials Engineering, Electrical Engineering +6

Anomalous Stress-Induced Hump Effects in Amorphous Indium Gallium Zinc Oxide TFTs

Yu-Mi Kim, Kwang‐Seok Jeong, Ho‐Jin Yun et al. · Transactions on Electrical and Electronic Materials · 2012 · 19 citations · Full text